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| United States Patent | 5,362,653 |
| Carr , et al. | November 8, 1994 |
In a method and apparatus for examining samples comprising individual objects (28) of macromolecular or similar size, or smaller, an instrument element (14) comprises a substrate (16) overlaid with a thin film layer (18) of a material that is electrically conductive and/or at last partly optically opaque. A discontinuity comprising an aperture (26) or an asperity is formed in or on the element (14) in a known location, and the sample (28) is brought to this discontinuity so that it is not necessary to search for the sample by scanning. Energy (e.g. electrical energy or light) is applied to the element (14) and, with the latter and the sample in intimate association, e.g. with the sample inside the aperture (26), changes in the radiation from the sample site resulting from the presence of the sample are detected.
| Inventors: | Carr; Robert J. G. (Salisbury SP4 6LN, GB), Clarke; David J. (Salisbury, Wilts, GB), Atkinson; Anthony (Salisbury SP4 6JJ, GB) |
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| Family ID: | 10662917 |
| Appl. No.: | 07/842,130 |
| Filed: | May 6, 1992 |
| PCT Filed: | September 12, 1990 |
| PCT No.: | PCT/GB90/01407 |
| 371 Date: | May 06, 1992 |
| 102(e) Date: | May 06, 1992 |
| PCT Pub. No.: | WO91/04507 |
| PCT Pub. Date: | April 04, 1991 |
| Sep 12, 1989 [GB] | 8920571 | |||
| Current U.S. Class: | 436/165; 324/71.1; 356/442; 422/73; 356/335; 356/441; 324/71.4; 422/82.05; 356/311; 436/149; 422/82.11; 850/18; 850/26; 850/63; 850/62; 356/317 |
| Current CPC Class: | G02B 21/0004 (20130101); G01N 15/1434 (20130101) |
| Current International Class: | G02B 21/00 (20060101); G01N 15/14 (20060101); G01N 021/17 (); G01N 029/00 () |
| Field of Search: | ;422/73,82.01,82.05,82.06,82.07,82.11 ;356/441,442,335,336,337,311 ;377/10 ;324/71.1,71.4,713 ;436/149,165 |
| 4420720 | December 1983 | Newton et al. |
| 4760328 | July 1988 | Groves |
| 4778657 | October 1988 | Spohr |
| 0296262 | Dec 1988 | EP | |||
| 0308537 | Mar 1989 | EP | |||
Fischer, J. Vac. Sci. Technol. B 3(1), Jan./Feb. 1985, pp. 386-390. . Durig, et al., IBM J. Res. Develop., vol. 30 No. 5, Sep. 1986, pp. 478-483. . Fischer, et al, Appl. Phys. Lett., 52(4), 25 Jan. 1988, pp. 249-250.. |
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